CIRCOGRAPH CI

Technical Data

Test material: Ferromagnetic, austenitic, and non-ferromagnetic material
Sensor system: Rotating sensor system with a maximum of two (Ro 20 and Ro 35) opposite test heads
Excitation frequencies: 30 kHz – 1 MHz
Max. throughput: 3 m/s during continuous testing
Defect display: from 30 µm at Ro 20 / Ro 35

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CIRCOGRAPH CI

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Compact test system for longitudinal surface defects

The CIRCOGRAPH CI combines a compact design with intuitive operation in one high-precision rotating test system. The CIRCOGRAPH CI features a user-friendly operation unit as well as easy “Turn-and-Push” rotary switch. The 2-channel system can be adjusted optimally to suit your test tasks thanks to a large range of different rotating heads. Longitudinal defects in the material surface can thus be detected from depths as low as 30 µm.

Your advantages at a glance:

  • Compact design
  • Simple operation thanks to integrated operation unit and “turn-push” operation
  • Universal testing system, can be adapted to individual applications and requirements
  • 2-channel test system
  • Seamless, continuous testing
  • Defect depth resolution from 30 µm

If you are interested in this product, please contact us!