CIRCOGRAPH DI

The system ensures a precise inspection of semifinished products for longitudinally oriented defects on the material surface. The different sensor systems ensure an optimal adaptation to the test task. Due to the compact design of the CIRCOGRAPH DI it is possible to integrate in almost any production line.

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CIRCOGRAPH DI – Precision testing of longitudinal defects

The CIRCOGRAPH DI ensures the same test quality as the CIRCOGRAPH CI with the basic functions, but this system does not have an integrated control computer. Optionally, the CIRCOGRAPH DI can be upgraded with additional functions, such as an archiving.
Operation, administration and archiving are carried out via an externally connected control computer. The system ensures a precise inspection of semifinished products for longitudinally oriented defects on the material surface. The different sensor systems ensure an optimal adaptation to the test task. Due to the compact design of the CIRCOGRAPH DI it is possible to integrate in almost any production line.

Your advantages at a glance:

  • Compact design facilitates easy integration in production processes
  • Simple operation thanks to external operation
  • Universal testing system, can be adapted to individual applications and requirements
  • 2-channel test system
  • Seamless, continuous testing
  • Defect depth resolution from 30 µm
  • Intuitive operating software

Economical test systems for applications with low feed rate

CIRCOGRAPH CI and DI are two compact test systems from FOERSTER. They’re perfect for when low test speeds and two channels suffice. These test instruments are often combined with the Ro 20 P rotating head, which allows you to check rods and tubes 2–20 mm in diameter directly in the production process. The material is inspected for surface defects before cold forming. The high functional diversity and compact dimensions of these instruments mean they can be used fl exibly in almost any production environment.

Technical Data

Test material: ferromagnetic, austenitic, and non-ferromagnetic materials
Sensor system: Rotating sensor system with a maximum of two (Ro 20 and Ro 35) opposite test heads
Excitation frequencies: 30 kHz – 1 MHz
Max. throughput: 3 m/s during continuous testing
Defect display: from 30 µm at Ro 20 / Ro 35

 

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